XPS is a surface analysis technique which is used to determine quantitative atomic composition and chemistry. This information can be used to compare surface treatments, identify stains and residues, and determine the root cause of adhesion problems. When combined with energetic ion sputtering, the resulting depth profiles can measure the composition of thin films as a function of depth.
This webinar will expand and sharpen your technical knowledge about XPS as you learn a new approach to problem-solving and failure analysis.
In this webinar we will cover:
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