This webinar will focus on Electron Backscatter Diffraction (EBSD).
EBSD is a rapidly developing technique in the material characterization field. The technique gives microstructure information in the meso-scale which includes grain size, crystal orientation, grain boundaries, dislocations, and phase identification that all contribute to the device performance and reliability.
Typical components that benefit from the EBSD analysis includes bond pads, solder joints, thin wires and capacitors.
Electron channeling contrast imaging (ECCI) is a derivative technique from EBSD that gives quantitively defect density measurement of single crystals. The scanning area is on the order of several tens to hundreds of micrometers making this measurement ideal for high quality crystals (defect density 108/cm2 to 105/cm2).
In this webinar we will demonstrate how we turn problems into solutions by presenting:
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