In this webinar we introduce Trace Analysis of Advanced Materials by Direct Solid-Sampling and Solution-Based Techniques. Trace and ultra-trace level elements are defined as elements present in a material at concentrations below 100 ppm weight or 1×1020 atoms/cm2.
The type, concentration and spatial distribution of trace elements are of particular concern to many advanced technologies, including but not limited to advanced metal alloys and ceramics, sputter targets, semiconductors, optics, medical devices, pharmaceuticals, batteries, sensors, catalysts, in additive manufacturing, in electronics, in aerospace, in nuclear energy industry, and in quantum computing. The success of these technologies and industries relies on the high purity feedstock (e.g., 99.995% + purity) and contamination-free processing and engineering. Trace elements are also purposefully added as dopants in some materials, but often with strict controls on the maximum and minimum levels. They play a variety of roles, affecting the performance, the reliability and the lifetime of many materials, parts and devices, particularly under dynamic load, extreme environment or harsh conditions.
Characterizing the levels and distribution of such small concentrations of an element can be analytically challenging and selecting the most appropriate technique for your material or a specific element requires understanding of the relative limitations and advantages of the many different analytical techniques available.
In this webinar we will cover:
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