Atomic Layer Deposition (ALD) Analysis

How do you characterize thin films? How do you troubleshoot Atomic Layer Deposition (ALD) product failures? How do you determine crystal structure?

EAG Laboratories has been helping product innovators with atomic layer deposition (ALD) support for over 20 years.
Our scientists and engineers provide the fast and actionable information you need for ALD development. We explain
what the data means, helping to troubleshoot problems and avoid development hurdles.

EAG knows that every minute counts. Our experts use the right techniques from our laboratories’ extensive range of instrumentation. Providing customized atomic layer deposition protocols with ultimate depth resolution, EAG can help you meet specifications with on-time and accurate results. From determining composition and detecting contaminants to understanding thin film structures, we support all phases of product development and life-cycle management.

H, C, O, and Fe Profiles by SIMS
H, C, O, and Fe Profiles by SIMS

EAG’s Services Supporting ALD Development

EAG services supporting ALD (atomic Layer deposition) analytical needs

Our ALD research and development services include:

  • Composition
  • Contaminant identification
  • Thickness
  • Uniformity
  • Density
  • Roughness
  • Thermal stability
  • Crystallinity

EAG’s pilot process and ramp-up services are:

For production support we offer process monitoring and validation measurement. At post-commercialization we provide failure analysis at the circuit, chip, board and system level, as well as supplier material verification and failure analysis projects.

Would you like to learn more about Atomic Layer Deposition (ALD) Analysis?

Contact us today for your Atomic Layer Deposition (ALD) analysis needs. Please complete the form below to have an EAG expert contact you.

To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.