Electrical Localization Capabilities using QFI Infrascope
QFI Instrument Services and electrical localization services from EAG Laboratories are upgraded with LSM and XIVA image.
The QFI InfraScope is a Temperature Mapping Microscope that provides reliability and thermal data.
The system has automated emissivity correction to produce a true temperature map with high temperature and spatial resolution. It has been used to check die and solder attachments on materials such as silicon, germanium, sapphire and zinc selenide.
Below are some examples of the data obtained
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