Level 1 Failure Analysis includes: non-destructive tests optical inspection, X-ray, C-SAM, and electrical characterization. This can complete an analysis or indicate the path for deeper analyses.
Level 1 non-destructive methods are recommended as a starting point for all failures as they will not alter the electrical properties of the device under test (DUT).
These tests gather as much information as possible before proceeding to analysis that requires destructive testing. Starting with Level 1 tests may even result in finding the root cause of failure.
The following shows examples of Level 1 testing
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