Multi-Layer Ceramic Capacitors (MLCCs) are essential components in modern electronics, delivering high capacitances in a compact form. They are ubiquitous in applications ranging from hand-held devices to automotive systems— a single smartphone can contain thousands of individual MLCCs. Despite their reputation for reliability, MLCCs can exhibit failure such as current leakage, aging, and thermal instability. Understanding how material properties influence long-term reliability is therefore critical.

The complex layered architecture and nanoscale features of MLCCs pose significant characterization challenges, particularly in quantifying subtle compositional variations that impact both performance and degradation. In this technical note, we present a correlative approach combining scanning transmission electron microscopy (STEM) along with atom probe tomography (APT) to enable targeted, high-resolution characterization of MLCCs.

Download the application note to learn more.