EMview™: SEM, FIB, TEM and STEM Data Processing Software

EAG Laboratories aims to provide our customers with additional value through exclusive features, such as our EMview™ image processing and viewing software for SEM, FIB, TEM and STEM images. You can measure features (even on tilted samples), change the brightness, contrast and gamma of an image, rotate an image, and print or export the results. Features of this software include:

  • Measure lines, angles, circles, ellipses and rectangles
  • Add text, lines, circles and rectangles to improve your data presentation
  • Rotate images
  • Change brightness, contrast and gamma
  • On most image types, the software uses the instrument calibration; ensuring the accuracy is the same as the OEM software
  • Images can also be re-calibrated, based on known feature sizes, including TEM lattice fringes

Results can be easily exported to a Windows clipboard or the image can be resaved as a JPEG or TIFF. EMview is available free of charge to our microscopy customers. Please note that EMview is designed to run on Microsoft Windows.

Registration Required

For licensing purposes, we require your contact information. This will also enable us to inform you of any updates or changes to the EMview software. The contact information you provide here will not be used for marketing purposes.

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