The EAG SMART (Spectroscopy and Microscopy Analytical Resolution Tool) Chart has graced the walls of leading labs and manufacturing companies both inside and outside Silicon Valley for the past 25 years
EAG published the first chart in 1995.
The latest version of our SMART Chart is now available in poster size!
Fill out the form to get a free poster-sized SMART chart mailed to you from your scientific partners at EAG Laboratories!
Please complete the form below.
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding materials characterization and failure analysis using Plasma FIB (PFIB). PFIB extends conventional DualBeam (DB) capabilities to nearly mm scale without the use of Gallium.
In this webinar we introduce Residual Gas Analysis (RGA), Evolved Gas Analysis (EGA), and Cumulative Helium Leak Detection (CHLD)
In the full webinar we will introduce analyzing VCSELs with a focus on secondary ion mass spectrometry (SIMS)
June 27, 2024
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Elemental Analysis with Inductively Coupled Plasma (ICP-OES, ICP-MS, LA-ICP-MS). These techniques provide full survey major, minor, trace element analysis, and purity certification for up to 69 measurable elements.
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