Analyses of Modified Glass Surfaces Webinar
In the full webinar we will focus on analyses of modified glass surfaces and thin coatings using Secondary Ion Mass Spectrometry (SIMS).
CS MANTECH 2025 Workshop
May 19, 2025
We are excited to announce that Eurofins EAG Laboratories will be presenting a workshop at the 2025 International Conference on Compound Semiconductor Manufacturing Technology in New Orleans, LA, May 19th-22nd.
Meet Jeff Serfass and Mike Salmon as they present on Monday, May 19th at the Hilton New Orleans Riverside in Louisiana.
Come visit us at booth 302 to learn more about our services and capabilities.
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Surface Contamination on Compound Semiconductors
Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.
Element Determinations in Photovoltaic (PV) Grade CdTe/CdS Powders
Photovoltaic Element Determinations by GDMS is ideally suited for trace element monitoring of PV grade CdTe/CdS materials.
The Versatility and Usefulness of Aerogels
The Versatility and Usefulness of Aerogels Thermal resistance and its complement, thermal conductance, are fundamental concepts in thermodynamics, thermal engineering, and heat transfer. They describe the ability of a material
Identification of Unknown Powders
This paper describes identification of two unknown powders using Raman spectroscopy, combined with two X-ray techniques
Eurofins EAG Expands Reliability Testing with Aehr Systems Tahoe Burn-In System
Eurofins EAG Laboratories has added the Aehr Sytems HP Tahoe Burn-In System, further enhancing its capabilities in stress testing and qualification of high-power and low-power semiconductor devices.