Extractables & Leachables West Summit 2025

Evaluating Electropolished Stainless Steel for Gas Distribution

Evaluating Surface and Oxide Composition of Electropolished Stainless Steel for High-Purity Gas Distribution Systems

Atomic Resolution EDS

Advances in thin film growth has created a need for characterizing structure and chemistry at the atomic scale using EDS.

Component Product Qualification Webinar

In this webinar we introduce Microelectronic Component Product Qualification to understand and consider component reliability.

Benefits of Image Processing

Image processing can be used to generate high density critical dimension measurements that allow us to extract the full profile of the interfacial roughness in a multilayer stack.

Using a special sample preparation technique and a new SIMS analytical protocol, individual SiC particles with a size ranging from 100 um to 500 um in a SiC powder sample can be analyzed. This innovative approach eliminates contributions from surface contamination to bulk concentration.

SIMS Analysis of Individual SiC Particles for Accurate Bulk Concentration Measurement

EAG’s SIMS Analysis Individual SiC Particles using a special sample preparation technique eliminates contributions from surface contamination

UHPLC, or Ultra-High-Performance Liquid Chromatography from EAG Laboratories

Ultra High Performance Liquid Chromatography (UHPLC)

EAG uses ultra-high-performance liquid chromatography (UHPLC) to separate, identify & analyze different constituents of a chemical compound