SOT 65th Annual Meeting and ToxExpo 2026

Full Wafer Particle Analysis of sub-50nm Defects by Auger Electron Spectroscopy

Auger (AES) spectra of small defects of various sizes shows excellent sensitivity is maintained down to a defect size of only 20nm.

Atomic-Resolution Secondary Electron Imaging

AC-STEM with Secondary Electron (SE) imaging provides the unique capability of evaluating specimen surface morphology with atomic-resolution.

For Medical Device Testing, Every Variable is Important

The analytical evaluation threshold (AET), an important part of the extractables and leachables testing in these studies, needs to be calculated for each instrumental technique.

submicron spatial resolution with a GaN device

Eurofins EAG Laboratories Latest Thermal Imaging Capabilities

Eurofins EAG Laboratories has enhanced its thermal imaging capabilities by adding Microsanj equipment that utilizes the principles of thermoreflectance and material index of refraction to provide unmatched spatial and temporal resolution.

Navigating Consumer Electronics Development: Finished Products

As a trusted partner in the consumer electronics industry, we are ready to meet the evolving industry needs, advancing innovation and excellence.

How Clean is Your Reliability Chamber?

A concern with Stress testing of electronic devices is the potential contamination of devices by a poorly maintained or cleaned chamber.