Package to Die: An Extraction Overview
With assemblies becoming more complex, incorporating technologies like multi-chip modules and 3D packaging, the need for precise extraction has grown significantly.
Eurofins EAG Enhances ATE Capabilities with New EXA Scale System
The EXA Scale tester features the CX compact test head, the smallest test head form factor in the series with nine slots.
The current configuration consists of three primary instruments:
- 1 XPS-256 (DC Instrument): Consists of 256 channels that can provide current up to 1A per channel up to 3V. It is gangable with up to 32 channels for a max rated current of 32A.
- 1 PS5000 (Digital Card): Consists of 256 channels capable of producing 5 Gbps or 2.5GHz clock signal. It has 256 single-end channels or 128 differential channels.
- 1 Wave Scale RF-20 (RF Instrument): Can source and measure from 100MHz to 20 GHz with stimulus and measurement bandwidth of 2GHz capability. It has 64 bi-directional ports designed for parallelism.
The density of the DC, Digital, and RF instrumentation allows for greater parallelism in multisite testing, thus reducing cost of test (CoT) and increasing throughput.
Common Applications:
- RF amplifiers, mixers, and transceivers
- Ultra-wideband (UWB) devices
- Cellular including 5G, WiFi-7, and many modern wireless standards.
ATE Test & Engineering at EAG
Eurofins EAG Laboratories delivers comprehensive ATE Test & Engineering solutions that assist with device performance and reliability. From custom test program development to reliability, burn-in, and failure analysis, EAG provides end-to-end support, a large and skilled team, and a fully equipped test floor with probers, handlers, and temperature forcing systems to our customers. Contact us to learn more.
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