LED Analysis
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
IRPS 2025 Presentation
March 30 - April 3
We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.
Meet Sinai Galvan as she presents her poster on Wednesday, April 2nd at the Hyatt Regency in Monterey.
Enhanced Dye and Pull for CSP Package Types
Abstract: In this paper, we successfully demonstrate the feasibility of performing Dye and Pull (D&P) Analysis on Chip Scale Package (CSP) types, for which the lab previously experienced structural failure during the pulling process repeatedly which greatly limited the useful information obtained.
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Ellipsometry Webinar
In this webinar we will focus on Spectroscopic Ellipsometry (SE) which is a powerful analytical tool for the characterization of thin films.
Ceramic Matrix Composites Emerge as Next Generation Aerospace Materials
One way to combat rising fuel costs in the aerospace industry and improve efficiency is to use new advanced materials such as Ceramic Matrix Composites (CMCs).
Benefits of Image Processing
Image processing can be used to generate high density critical dimension measurements that allow us to extract the full profile of the interfacial roughness in a multilayer stack.
Aerospace and Defense Brochure
Your trusted partner in Aerospace and Defense testing and analytical services
Semiconductor Stress Measurements by Raman Spectroscopy
Semiconductor stress measurements by Raman Spectroscopy helps control problems related to stress control in semiconductor devices, from EAG.