The Crucial Role of Warpage Analysis
Warpage Analysis serves as a valuable tool for measuring the warpage and deformation experienced by products under thermal stresses.
Advances in the Semiconductor Industry with Gallium Oxide
As technology advances the attractiveness of being able to travel further, faster and with environmental efficiently increases as well. One aspect which the semiconductor industry can address is power conversion for electric trains and vehicles. Power devices are made from a variety of materials including silicon carbide (SiC) and gallium nitride (GaN). More recent research focuses on the unique properties of gallium oxide (Ga2O3)
What is Gallium Oxide (Ga2O3)?
Gallium oxide (Ga2O3) is a material which has the potential to replace or substitute gallium nitride (GaN) in power conversion devices. One advantage of gallium oxide over gallium nitride (GaN) is its ability to be grown in bulk. Bulk gallium nitride, or even GaN thin films (GaN) tend to form structural defects which affect device performance. Gallium oxide (Ga2O3) can be used at a higher voltage resulting in increased efficiency. Some potential applications could be electric vehicles due to higher voltage transistors (for inverter or converter), electric trains which need super high-powered devices, and other applications outside of power conversion such gas sensors.
There are some challenges with gallium oxide (Ga2O3) that need to be addressed before it can become mainstream. For example, with gallium oxide (Ga2O3) the thermal conductivity is not as good as other materials which may cause a device to overheat.
EAG Offers Wide Range of Materials Testing Techniques for Gallium Oxide (Ga2O3) Analysis
Currently, there are not many companies investigating this material, but that can change quickly with the ever-evolving semiconductor market. When that shift occurs Eurofins EAG Laboratories is ready as we offer a wide selection of techniques which can be used to analyze this material and ensure its safety for use. EAG scientists can use Transmission Electron Microscopy (TEM), Glow Discharge Mass Spectrometry (GDMS Analysis) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS) to study the material in depth as well as Secondary Ion Mass Spectrometry (SIMS Analysis) to measure the dopant profile of the material and provide imaging to analyze the crystal defect.
As the semiconductor industry continues to grow and evolve EAG will be your partner to make sure your end-product operates well and safely. We are ready to help you with your analyses so contact us today to begin the process.
More content you might like...
Dye & Pry Webinar
In this webinar we introduce Dye and Pry that involves cleaning a sample to remove debris & flux around solder, then exposing it to a red dye.
Failure Analysis in a Complex World Webinar
In this webinar we show how EAG troubleshoots electronic system failures using a multidisciplinary approach
Flying Safely – Corrosion Testing for the Aviation Industry
Eurofins EAG Laboratories (EAG) is a leader in corrosion testing employing a multidisciplinary approach and advanced techniques to aid manufacturers in improving their products’ reliability.