AABC 2022

Comparison between EDS and EELS

EDS and EELS are elemental analysis techniques integrated with electron microscopes such as TEM (Transmission Electron Microscope)

Catheter and Balloon Analysis

Catheter and balloon analysis for medical device development support includes deformulation, contaminant identification and failure analysis.

Standards for SIMS

EAG Laboratories can offer a range of standards for SIMS used to calibrate materials such as Si, SiO2, SiN, Wsi, TiN, TiW, Al, GaAs, InP.

Coffee & Conversations: Contamination Measurements

November 2, 2023
Please join us for coffee and conversations! Enjoy a cup of coffee and pastries as you get to know our technical experts.

Atomic Force Micrscopy (AFM), polymer surface data, as-received

AFM Polymer Surface Modification

Polymer surface modification by Atomic Force Microscopy (AFM) for understanding surfaces of medical device polymers for biocompatibility.

Unlocking the Power of Automated Test Equipment (ATE) and Customized Solutions

Automated Test Equipment (ATE) systems are carefully designed to test a wide range of semiconductor devices. EAG provides tailored ATE test solutions to meet the unique needs of clients.