AIAA SciTech Forum and Exposition 2026

Failure Analysis of Reliability Webinar

In this webinar we introduce The Failure Analysis of Reliability Testing Samples as applied electronic and semiconductor devices

Z-Contrast image of silicon dumbells. The bright spheres are columns of silicon atoms with a spacing of 0.136nm, highlighting the outstanding image resolution of the technique.

Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) Services

Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) significantly improves the resolution of the traditional STEM tools.

FTIR spectrum of dioctyl phthalate plasticizer

Fourier Transform Infrared Spectroscopy (FTIR) Services

FTIR Services information from EAG Laboratories includes typical data, principles, strengths and limitations from our FTIR lab.

Ask the Experts: Materials Characterization of GaN Power Transistors

Demand for compound semiconductors has rapidly grown recently. During this live event we answered questions surrounding the Materials Characterization of GaN HEMT power transistors.

Cryo TEM for battery and air sensitive materials

When Temperature Matters – Cryo TEM

Cryo TEM involves performing TEM analysis while keeping the sample at cryogenic temperatures, around -170°C.

Morphology and Chemical Analysis of Particles now available

6th September 2019
Morphology and Particle Analysis measures particle size and shape along with particle chemistry, for high throughput elemental analysis.