Bay Area Biomedical Device Conference

Advancing Semiconductor Failure Analysis: Eurofins EAG’s Plasma FIB Delayering

At Eurofins EAG Laboratories, we have utilized Plasma Focused Ion Beam (PFIB) to overcome the limitations of traditional deprocessing methods.

FTIR and Contact Angle Measurements of Surface Modified Polymers

Fourier Transform Infrared Spectroscopy (FTIR) is a analytical technique for characterizing organic and some inorganic materials

XRD Webinar

In this webinar we introduce X-ray Diffraction (XRD) which is a analytical technique for the examination of crystalline materials.

Characterization of Crystalline structures – SEM-EBSD vs TEM-PED

Besides images provided by SEM and TEM, different attachments can be added to reveal crystalline information, including (SEM-EBSD) and TEM (TEM-PED).

Molded In Stresses

Cracks were observed in transparent thermoformed plastic packaging during visual quality checks. Failures occured in specific material lots.

Uniformity is Key in Epitaxial Growth

AC-STEM analysis can provide a visual representation of non-uniformities in an active region. Roughness can easily be observed within interfaces. EDS maps can then be used to corroborate the roughness in relation to composition.