Bay Area Biomedical Device Conference

Table 1 Concentration of Elements Detected on Failed Surfaces (in atom%)

Cause and Location of Delamination of Multi-layer Metal Foil by XPS

Laminate failure : Multi-layer laminate by analysis by XPS. Investigation details adhesive failure at a Ni2Mo-Cu interface due to monolayer contamination.

Characterization of Surface Metallic Contamination

To identify and quantify contaminants, utilizing both TXRF and SurfaceSIMS.XP provides surface measurements on semiconductor surfaces.

Silicon Carbide SIMS Measurements, Modified Cameca 4f Sample Intro System

SIMS Analysis Tips – What is the effect of mass interference?

Secondary ion mass spectra measured by SIMS may not always provide information from the target element alone.

SIMS services, typical data from EAG Laboratories

Secondary Ion Mass Spectrometry (SIMS) Services

SIMS services from EAG is featured in this technique note, including sample data, showing how SIMS detects low concentrations of impurities

Exploring the Capabilities of Dual-Beam FIB-SEM

The dual-beam FIB – SEM is an advanced tool that combines precise sample milling/preparation with high-resolution imaging.

Food Investigations and Crisis Management

EAG experts guide manufacturers, processors and distributors through food investigations and help save time and money in crisis management.