Bay Area Biomedical Device Conference

Quantification of Bisphenol A

BPA analysis to quantify Bisphenol A levels in products using proprietary analytical methods using HPLC with a flourescence detector.

SCM image of the cross sectioned Power MOSFET

Scanning Capacitance Microscopy (SCM) of a Power MOSFET

SCM provides doped region distribution mapping, profiling and dimensional analysis for the research and development, failure analysis and quality control of electronic components.

Example of metallurgical analysis from EAG Laboratories

EAG welcomes Metallurgical Experts

11th March 2016
EAG welcomes metallurgical experts SEAL Labs, a leader in metallurgical investigations, failure analysis and litigation support.

XPS Analysis of Disposable Gloves

XPS Analysis of Disposable Gloves assesses materials exposed during product manufacturing to make sure contamination is not introduced.

SIMS Detection Limits of Selected Elements in InP Under Normal Depth Profiling Conditions

SIMS Detection Limits of Selected Elements in InP for impurities in InP matrices with normal depth profiling conditions.

IGA Webinar

This webinar will focus on Instrumental Gas Analysis (IGA) that measures gas-forming elements present in solid materials.