Which method of sectioning is best for my sample?
Cross sectioning of a semiconductor die is a basic step in failure analysis work. A cross section can be used as a check of layer integrity.
North American Biocompatibility Summit (NABS)
September 13, 2023
Eurofins EAG Laboratories is the presenting sponsor for the North American Biocompatibility Summit (NABS) at Quincy Hall in Minneapolis, Minnesota.
Philip Ferko, Ph.D., will present “Identification in 10993-18 Chemical Characterization Studies: Standard, Approaches, Challenges” during the afternoon session.
We hope to see you there!
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