BioInterface

Statistical Analysis of 3D Particles Using FIB SEM Tomography

Statistical Analysis of Three-Dimensional Particles Using FIB-SEM Tomography and Image Processing

FIB-SEM tomography and image processing enable us to extract statistical analysis of particles from three-dimensional and high-resolution imaging data.

SOT ToxExpo 2025

March 17-19, 2025
Eurofins EAG Laboratories will be presenting and exhibiting at the SOT ToxExpo in Orlando.

Chemical Analysis of Plasma Resistant Ceramic Coatings

High resolution GDMS is recognized as one of the most versatile direct sampling techniques for survey chemical analysis of solids.

SIMS measurement of Bulk [N], Table 1 Long term RSDs for three levels of [N]

SIMS Measurement of Bulk [N] in Nitrogen-doped Cz-Si: Long Term Precision Results

We have improved the SIMS measurement precision using the ASTM F 2139 test method and extended the detection capability into the 1×1013/cm3 levels.

Depth Profile Characterization of Low-K Materials Using Secondary Ion Mass Spectrometry

SIMS depth profile characterization provides accurate quantification for all measured species and matrix using our unique reference materials

Characterization of Surface Contamination

A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.