
Characterization of Crystalline structures – SEM-EBSD vs TEM-PED
Besides images provided by SEM and TEM, different attachments can be added to reveal crystalline information, including (SEM-EBSD) and TEM (TEM-PED).
Home » Checking Local Bonding in VCSEL Apertures
VCSELs, or vertical cavity surface emitting lasers, are an essential technology we rely on every day. They can be found in commonplace equipment such as your computer mouse and laser printer, to advanced sensors such as LIDAR or even data storage applications. Although they are increasingly common, their properties are highly tunable and require rigorous development to prepare a reliable and efficient product.
There are many key components of the VCSEL, but one challenging region is the oxide aperture. The oxide aperture is responsible for current confinement, and it is important to have high quality oxidation to prevent failure of the device. Although VCSELs can exhibit failure in many ways, it is important to characterize the failure and determine how it could be prevented in future products. EAG can help!
AC-STEM analysis can provide a visual representation of localized device regions. From atomic structure to local bonding – AC-STEM unlocks key sample features that are important to understand for modern devices. For example, correct oxidation of the VCSEL aperture layer is key.
During the oxidation process, getting the correct layers to oxidize without forming unwanted phases is important. AC-STEM with EELS can be utilized to understand variations in the oxide layer with nanoscale resolution.
AC-STEM imaging is essential towards studying these types of fine sample features because bulk techniques lack the necessary spatial resolution. By combining this type of analysis with other Eurofins EAG services such as SIMS, it is possible to gain a clear understanding of the VCSEL device structure and composition with atomic scale resolution and dopant level composition sensitivity.
Contact us today to learn how we can help you on your next project.
Besides images provided by SEM and TEM, different attachments can be added to reveal crystalline information, including (SEM-EBSD) and TEM (TEM-PED).
ICP-MS is a multi-elemental bulk chemical analysis technique that can determine simultaneously up to 70 elements in a single sample.
In this webinar we introduce full Survey Chemical Analysis of Materials Used in Energy Storage Devices such as lithium ion batteries
February 12, 2025
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Silicon Carbide for High Powered Electronics. EAG Laboratories has a vast depth of experience analyzing silicon carbide using both bulk and spatially resolved analytic techniques and is the world-leading materials characterization and engineering resource for semiconductor testing.
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