Graphite Anode Half-Cell Formation and Rate Performance Evaluation
This application note describes the assembly, Neware cycling protocol, and electrochemical interpretation of graphite anode half-cells.
7th Annual BIC Industry Luncheon
April 29, 2005
We are honored to be the keynote speaker at the 7th Annual BIC (Battery Innovation Center) Industry Luncheon in Indianapolis, IN on April 29th. Dr. Daniel Liu will be presenting Battery Testing Services.
As batteries become increasingly integral to our everyday lives, the demand for comprehensive battery testing and material analysis has intensified.
In 2024, EAG expanded its battery materials testing capabilities with the opening of a dedicated battery laboratory. The laboratory is equipped with state-of-the-art facilities, including a full dry room, two glove boxes, a range of battery cycle testers (suitable for all battery types from coin cells to full EV packs), and advanced analytical tools such as SEM/EDS, a 3D scanner, particle size analyzer, auto-titrator, and residual gas analyzer. Our laboratory offers a full suite of battery testing services, including battery life and accelerated life testing, failure analysis, materials characterization and qualification of battery raw materials. We also have direct access to EAG’s full range of analytical techniques for materials identification, contaminant analysis, imaging, chemical analysis, phase ID, thermal analysis, electrical testing and non-destructive imaging.
No matter the nature of your battery-related inquiry, EAG’s battery laboratory is here to provide the expertise and solutions you need. This presentation will demonstrate our expertise through a series of case studies and examples utilizing our equipment range and industry experience to address battery-related problems.
Contact us to learn more about our battery materials analysis services.
We hope to see you there!
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SIMS Detection Limits of Selected Elements in GaAs Under Normal Depth Profiling Conditions
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For Medical Device Testing, Every Variable is Important
The analytical evaluation threshold (AET), an important part of the extractables and leachables testing in these studies, needs to be calculated for each instrumental technique.
High Resolution X-ray Diffraction (HR-XRD) Measurement of Compound Semiconductors
HR-XRD Measurement of Compound Semiconductors can be used to determine the composition of strained layers and thickness.
Impurity depth direction analysis of various glass materials by SIMS
SIMS analysis is used to measure trace impurities in various materials such as semiconductors, metal, and insulating materials
West Coast Failure Analysis Seminar
June 3-4, 2025
Join us for our Failure Analysis seminar! Enjoy networking with peers and expert technologists, share challenges in our interactive user group session, and take advantage of optional tours of nearby lab facilities.