We are excited to announce Eurofins EAG Laboratories will exhibit at the International Conference on Compound Semiconductor Manufacturing Technology (CS Mantech) from May 18-21, 2026 in Portland, OR. We’ll be joining them in celebrating 40 years!
Stop by our booth #317 to visit with our team and learn more about our solutions for the compound semiconductor industry.
We hope to see you there!
Battery characterization improves lithium-ion battery safety and performance using techniques such as SEM, TEM, XPS, GDMS, FTIR, ICP-OES, Raman and failure analysis
FA plays a critical role in product development and improvement. During this live Ask the Expert event, we will answer pre-submitted questions from our audience about electronic device failure analysis.
Cryogenic focused ion beam and scanning electron microscopy is a technique used to reduce damage caused by ion and electron beams.
Eurofins EAG Laboratories, a global leader in materials testing services, is expanding its advanced microscopy capabilities with a new 6,800 square-foot laboratory in Phoenix, AZ.
Damage caused by ESD is one of the primary failure mechanisms for integrated circuits. Testing susceptibility to ESD events is crucial in the success of electronic devices and is essential for the qualification process.
25th August 2023
We are thrilled to announce our latest nanoprobing capabilities at EAG, powered by cutting-edge Kleindiek equipment. Nanoprobing is an advanced analytical technique that enables the direct measurement and characterization of front and backend structures.
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