EAG Metallurgical Experts Investigate Turbine Failure
23rd July 2018
Metallurgical experts from EAG discovered the cause of an aircraft crash by discovering the fatigue crack initiation of the turbine blades.
IRPS 2025
March 30 - April 3, 2025
We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.
Meet Dr. Daniel Liu as he presents his poster on Wednesday evening, April 2nd from 6:00 – 9:00 pm at the Hyatt Regency in Monterey.
Failure Analysis of Particle Contamination in Battery
Abstract: In this poster, a battery failure analysis process was conducted to identify the root cause of a failed battery. Initially, a 2D X-ray imaging was employed to detect anomalies in the sample. Subsequent disassembly in an argon glove box of the battery facilitated the recovery of particle contaminants. Finally, airless transfer to SEM/EDS allows imaging and elemental analysis of these contaminants revealed the underlying failure mechanism.
Contact us to learn more about our Battery Materials Analysis services.
We hope to see you there!
More content you might like...
Support for Complex and Challenging Product Liability Litigation
Product liability cases have many complexities and challenges and require top-notch legal services. Navigating the intricate details of these cases requires not only legal insight but also specialized expertise in various technical and regulatory domains.
Design an Effective Chemical Characterization Study for Your Device
May 15, 2024
Check out our online symposium presented by EAG Laboratories and Exponent!
Evolved Gas Analysis with Thermogravimetric Analysis (TGA-MS)
TGA with hyphenated technologies such as infrared (IR) and/or mass spectrometry (MS) is investigates the outgassing behavior of materials
APT Webinar
In this webinar we introduce Atom Probe Tomography (APT) which is a technique that provides three-dimensional (3D) chemical and spatial maps.
SIMS Analysis Tips – What is the effect of mass interference?
Secondary ion mass spectra measured by SIMS may not always provide information from the target element alone.