IRPS 2025

IRPS Poster Presentation: Failure Analysis of Particle Contamination in Battery

March 30 - April 3, 2025

We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.

Meet Dr. Daniel Liu as he presents his poster on Wednesday evening, April 2nd from 6:00 – 9:00 pm at the Hyatt Regency in Monterey.

Failure Analysis of Particle Contamination in Battery

Abstract: In this poster, a battery failure analysis process was conducted to identify the root cause of a failed battery. Initially, a 2D X-ray imaging was employed to detect anomalies in the sample. Subsequent disassembly in an argon glove box of the battery facilitated the recovery of particle contaminants. Finally, airless transfer to SEM/EDS allows imaging and elemental analysis of these contaminants revealed the underlying failure mechanism.

Contact us to learn more about our Battery Materials Analysis services.

We hope to see you there!

More content you might like...

jade jewelry

Fingerprinting for Phase Identification

Minerology was one of the earliest fields to benefit from X-ray Diffraction (XRD). Prior to XRD, minerals could only be identified by their external symmetry, shape, and color. XRD transformed mineral identification into an exact science, being perfect for characterizing crystalline materials by their internal structure, not just external appearance.

Read More »

TEM

To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.