Material Reliability Test of PLA Polymer Degradation
This App Note shows the approach of EAG Laboratories to test the material reliability of PLA Polymer Degradation
NPE 2024 – The Plastics Show
May 6-10, 2024
Eurofins EAG Laboratories will be attending NPE 2024 – The Plastics show in Orlando, Florida in May. Come visit us at booth W5584 to learn more about our services and capabilities.
We hope to see you there!
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Atomic-Resolution Secondary Electron Imaging
AC-STEM with Secondary Electron (SE) imaging provides the unique capability of evaluating specimen surface morphology with atomic-resolution.
Chemical Analysis of Plasma Resistant Ceramic Coatings
High resolution GDMS is recognized as one of the most versatile direct sampling techniques for survey chemical analysis of solids.
Surface Characterization of Antibacterial Coated Sutures
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Which method of sectioning is best for my sample?
Cross sectioning of a semiconductor die is a basic step in failure analysis work. A cross section can be used as a check of layer integrity.
SIMS Analysis of Al and Ga Diffusion
SIMS detects very low concentrations of dopants and impurities. It has been used to study the diffusion of Al and Ga.