Latest Advancement in Transmission Electron Microscopy
9th December 2020
EAG Laboratories has completed installation of a ThermoFisher Scientific Themis Z Transmission Electron Microscope (TEM)
NPE 2024 – The Plastics Show
May 6-10, 2024
Eurofins EAG Laboratories will be attending NPE 2024 – The Plastics show in Orlando, Florida in May. Come visit us at booth W5584 to learn more about our services and capabilities.
We hope to see you there!
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EAG to Speak at M&M 2024
July 29, 2024
Eurofins EAG Laboratories will be presenting Automated Bandgap Measurements in Optoelectronic Devices by Monochromated Electron Energy-Loss Spectroscopy at Microscopy & Microanalysis on July 29th.
Full Wafer Particle Analysis of sub-50nm Defects by Auger Electron Spectroscopy
Auger (AES) spectra of small defects of various sizes shows excellent sensitivity is maintained down to a defect size of only 20nm.
Effects of Stress on Medical Devices
Knowing the type of stress and how much there is in a small metal component in a medical device can be the determining factor on how well the device will perform, how long the device will last, or even whether or not the device is going to work at all.
Depth Profile Characterization of Low-K Materials Using Secondary Ion Mass Spectrometry
SIMS depth profile characterization provides accurate quantification for all measured species and matrix using our unique reference materials
The Birth of PCOR-SIMS for Silicon Germanium (SiGe) Devices
PCOR-SIMS was originally developed to analyze Silicon Germanium (SiGe) devices for the communications industry.