NPE 2024 - The Plastics Show - EAG Laboratories

Battery Recycling Services

Battery recycling of key materials such as cobalt, nickel, and lithium require precise and accurate determination of elemental compositions

Z-Contrast image of silicon dumbells. The bright spheres are columns of silicon atoms with a spacing of 0.136nm, highlighting the outstanding image resolution of the technique.

Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) Services

Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) significantly improves the resolution of the traditional STEM tools.

Analytical Approaches for Food & Beverage Webinar

In this webinar we introduce the analytical approaches for solving food and beverage challenges including contamination.

Figure 1 Al contamination on a bare silicon wafer measured with SurfaceSIMS.XP.

Characterization of Surface Aluminum Contamination on Processed Silicon Wafers

Surface Aluminum Characterization highlights advantages of using SurfaceSIMS.XP to determine contamination on processed Si wafers.

Ask the Expert: Failure Analysis of Electronic Devices

FA plays a critical role in product development and improvement. During this live Ask the Expert event, we will answer pre-submitted questions from our audience about electronic device failure analysis.

Chemical Analysis of Plasma Resistant Ceramic Coatings

High resolution GDMS is recognized as one of the most versatile direct sampling techniques for survey chemical analysis of solids.

NPE 2024 – The Plastics Show

May 6-10, 2024

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