XPS Analysis with C60 Sputtering
XPS Analysis for sputter etching polymers and other organic materials to provide chemical characterization and depth profiling
NPE 2024 – The Plastics Show
May 6-10, 2024
Eurofins EAG Laboratories will be attending NPE 2024 – The Plastics show in Orlando, Florida in May. Come visit us at booth W5584 to learn more about our services and capabilities.
We hope to see you there!
More content you might like...
Reliability Testing Webinar
In this webinar we introduce setting up reliability test plans, processing reliability data and the relation to the lifetime of a product
SIMS Detection Limits of Selected Elements in InP Under Normal Depth Profiling Conditions
SIMS Detection Limits of Selected Elements in InP for impurities in InP matrices with normal depth profiling conditions.
SIMS Measurements of Silicon Carbide
Silicon Carbide SIMS Measurements provide valuable data for process control and problem solving in wafer growth and device manufacturing.
Consumer Product Biocompatibility Testing Webinar
Wednesday, May 14, 2025
This webinar will cover the chemical characterization of consumer products using extractable/leachable studies. Register to reserve your spot today!
A materials analysis study into FinFET technology
We provide a materials analysis study into the comparison between 22 nm node and 7 nm node FinFET technologies, using TEM-based techniques.