NPE 2024 - The Plastics Show - EAG Laboratories

SIMS is a powerful analytical technique which allows detection of all elements from H to U with excellent sensitivity. The table provides a list of typical detection limits for impurities in a SiC matrix. These detection levels are for normal depth profiling conditions of blanket wafers.

SIMS Detection Limits of Selected Elements in SiC Under Normal Depth Profiling Conditions

SIMS detection of all elements from H to U with excellent sensitivity. The table provides detection limits for impurities in a SiC matrix.

AVS 71 International Symposium and Exhibition

September 21-26, 2025
We are excited to announce that Eurofins EAG Laboratories will be speaking at the AVS 71 Symposium in Charlotte, NC, September 21-26.

Will the Newest Wearable Device Leave You Itching for More?

Consumer wearables are evaluated for sensitizers by extractable & leachable studies. We describe how to evaluate potential safety issues.

Complementary Techniques: X-Ray & SAM

Complementary Techniques: X-Ray & SAM X-ray imaging is a great non-destructive technique that is used in many industries to help visualize internal construction. Scanning acoustic microscopy (SAM) is another non-destructive

Is there proof that your hand sanitizer is effective?

EAG is equipped with the necessary tools and techniques to examine hand sanitizer gel products for their primary ingredients

Evaluating the Cleanliness of Medical Devices

Eurofins EAG has a wide array of analytical techniques to verify the cleanliness of medical devices. We’ve helped our customers evaluate the cleanliness of their products using techniques including NVR analysis, often in combination with FTIR, XPS and TOF-SIMS.

NPE 2024 – The Plastics Show

May 6-10, 2024

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