Secondary Ion Mass Spectrometry Survey Depth Profile
Survey-SIMS Depth Profiles analyze for dopants & impurities in a material without having prior knowledge in the structure being evaluated.
IRPS 2025 Presentation
March 30 - April 3
We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.
Meet Sinai Galvan as she presents her poster on Wednesday, April 2nd at the Hyatt Regency in Monterey.
Enhanced Dye and Pull for CSP Package Types
Abstract: In this paper, we successfully demonstrate the feasibility of performing Dye and Pull (D&P) Analysis on Chip Scale Package (CSP) types, for which the lab previously experienced structural failure during the pulling process repeatedly which greatly limited the useful information obtained.
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