Atomic Pair Distribution Function (PDF)

Pair Distribution Function (PDF) analysis is a real-space structural analysis method that provides insight into the local atomic arrangement of materials. Unlike conventional diffraction, which relies primarily on long-range periodicity and Bragg peak analysis, PDF incorporates both Bragg and diffuse scattering to capture short-range order and local structural deviations. Applying the Fourier transform to the total scattering structure function, S(Q), in real space yields the function “G(r)”, which describes the probability of finding atomic pairs separated by distance r, relative to a random distribution.

PDF analysis is particularly powerful for studying materials where disorder, defects, nanoscale crystallite size, or limited periodicity obscure or eliminate traditional diffraction features. It enables precise investigation of local coordination environments, bond lengths, strain fields, cluster size effects, and defect-induced distortions, which are critical parameters in complex and functional materials.

Atomic Pair Distribution Function (PDF)

Ideal Uses of PDF

PDF is ideally suited for systems where average crystallographic models fail to capture local structural behavior, including:

  • Nanocrystalline and ultra-nanocrystalline materials
  • Amorphous and glassy materials
  • Polymers, soft materials, and hybrid structures (e.g., MOFs)
  • Disordered crystalline systems and materials with substantial strain or defects
  • Battery electrode materials, catalysts, and energy-conversion compounds
  • Complex oxides and correlated-electron systems
  • Local coordination studies in metals, semiconductors, and ceramics
  • Structure determination (in limited capacity)

Strengths

  • Resolves local atomic environments independent of long-range order
  • Sensitive to defects, distortions, vacancies, and disorder
  • Applicable to crystalline, nanocrystalline, and amorphous systems
  • Capable of resolving bonding environments and coordination shells
  • Enables real-space modeling and quantitative refinement
  • Complements XRD, XAS, TEM, Raman, and total scattering techniques

Limitations

  • Requires high-energy X-rays and wide Q-range for optimal fidelity
  • Data collection is typically longer than routine diffraction scans
  • Modeling requires specialized software and expertise
  • Interpretation can be non-unique without complementary methods
  • Surface-dominated effects may complicate thin-film PDFs unless tailored geometry is used

PDF Technical Specifications

  • Data type: total scattering (Bragg + diffuse)
  • Output: real-space PDF G(r)
  • Typical Qmax:  17.3 Å⁻¹ (Mo Source)
  • Real-space resolution: Δr ~ 0.02–0.05 Å
  • Sample form: powder, thin films, liquids, solids
  • Typical sample measurements: 1–20 mg (powder) for transmission geometry, >1 g (powder) for reflection geometry, thin films size of 2 x 2 cm2
  • Analysis software: Studio II, FullPDF, PDFgui, GSAS-II (PDF module)
  • Key observables: bond distances, coordination, nanoscale ordering, defect distribution

Would you like to learn more about PDF analysis?

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