Pair Distribution Function (PDF) analysis is a real-space structural analysis method that provides insight into the local atomic arrangement of materials. Unlike conventional diffraction, which relies primarily on long-range periodicity and Bragg peak analysis, PDF incorporates both Bragg and diffuse scattering to capture short-range order and local structural deviations. Applying the Fourier transform to the total scattering structure function, S(Q), in real space yields the function “G(r)”, which describes the probability of finding atomic pairs separated by distance r, relative to a random distribution.
PDF analysis is particularly powerful for studying materials where disorder, defects, nanoscale crystallite size, or limited periodicity obscure or eliminate traditional diffraction features. It enables precise investigation of local coordination environments, bond lengths, strain fields, cluster size effects, and defect-induced distortions, which are critical parameters in complex and functional materials.
Ideal Uses of PDF
PDF is ideally suited for systems where average crystallographic models fail to capture local structural behavior, including:
Nanocrystalline and ultra-nanocrystalline materials
Amorphous and glassy materials
Polymers, soft materials, and hybrid structures (e.g., MOFs)
Disordered crystalline systems and materials with substantial strain or defects
Battery electrode materials, catalysts, and energy-conversion compounds
Complex oxides and correlated-electron systems
Local coordination studies in metals, semiconductors, and ceramics
Structure determination (in limited capacity)
Strengths
Resolves local atomic environments independent of long-range order
Sensitive to defects, distortions, vacancies, and disorder
Applicable to crystalline, nanocrystalline, and amorphous systems
Capable of resolving bonding environments and coordination shells
Enables real-space modeling and quantitative refinement
Complements XRD, XAS, TEM, Raman, and total scattering techniques
Limitations
Requires high-energy X-rays and wide Q-range for optimal fidelity
Data collection is typically longer than routine diffraction scans
Modeling requires specialized software and expertise
Interpretation can be non-unique without complementary methods
Surface-dominated effects may complicate thin-film PDFs unless tailored geometry is used
PDF Technical Specifications
Data type: total scattering (Bragg + diffuse)
Output: real-space PDF G(r)
Typical Qmax: 17.3 Å⁻¹ (Mo Source)
Real-space resolution: Δr ~ 0.02–0.05 Å
Sample form: powder, thin films, liquids, solids
Typical sample measurements: 1–20 mg (powder) for transmission geometry, >1 g (powder) for reflection geometry, thin films size of 2 x 2 cm2
Analysis software: Studio II, FullPDF, PDFgui, GSAS-II (PDF module)
Key observables: bond distances, coordination, nanoscale ordering, defect distribution
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