Eurofins EAG Laboratories is pleased to announce the expansion of its electrical characterization portfolio with the addition of Four-Point Probe (4PP) sheet resistance testing capabilities, further strengthening support for semiconductor, thin-film, display, and advanced materials development and quality control.
Four-Point Probe testing is a precise, non-destructive electrical technique that passes a known current through two outer probes and measures the resulting voltage drop across two inner probes. By eliminating the effect of contact resistance, 4PP enables highly accurate measurements of sheet resistance and conductivity across a wide variety of conductive and semiconducting layers.
Four-Point Probe testing is primarily used across these key applications, grouped by industry:
Semiconductor & Microelectronics
Solar & Photovoltaics
Thin Films & Advanced Coatings
Energy Storage & Displays
Results are typically presented as sheet resistance values or conductivity, allowing engineers and scientists to identify spatial variations and performance-limiting defects within complex thin-film and semiconductor systems.
Contact us to learn more about our Four-Point Probe testing services and how we can support your next project.
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