Silicon

Welcome to our resource page where we have created a series of articles that we hope you will find engaging, and helpful. Please check back as we are continuing to add more content, and follow us on social media.

How Ion-TOF SIMS Uncovers Hidden Layers in Semiconductors

Uncover the invisible architecture of semiconductors with depth profiling using ion-TOF SIMS. This advanced technique reveals layer-by-layer composition in materials like silicon, GaN, and SiC. Learn how Eurofins EAG Laboratories supports your analysis with state-of-the-art tools and world class expertise.

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PED

PED Webinar

In this webinar we introduce Precession Electron Diffraction (PED) which has been essential to nano-scale structural analysis

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TEM

TEM Webinar

In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.

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